Atomic Force Microscopy (AFM)
5300E, 5500M
This measurements shown the image on the monitor, can record the sample image and measure width, range, height and angle of sample.
Specifications
| Version | Description |
|---|---|
| Hitachi5300E | - High vacuum SPM which provides various measurement conditions, such as air, liquid, vacuum, humidity and temperature control.
- Vacuum chamber enables clear and high resolution observations of electromagnetic properties and in-situ observations at high and low temperatures - Scan range 100µm × 100µm × 15µm - Temperature Control -120°C to 300°C R.T. to 800°C In liquid: from R.T. to 60°C - in air in a liquid in a vacuum temperature control humidity control support |
| Hitachi5500M | - Innovative design for research applications
- Correlative AFM and SEM imaging - Wide-open tip and sample access - Fully addressable 4-inch stage eliminating the need for sample remount/rotation - Point-and-click function enabling easy and quick camera-based sample navigation - Easier, faster, and more precise AFM imaging - Automated cantilever exchange - Automated laser alignment - Automated image optimization (RealTune® II) - Automated AFM measurements following a recipe |