NCTC http://nctc.in.th NSTDA Characterization and Testing Service Center Sun, 23 Sep 2018 19:28:47 +0000 en-US hourly 1 https://wordpress.org/?v=4.9.8 http://nctc.in.th/wp-content/uploads/2018/06/cropped-logonctc-32x32.png NCTC http://nctc.in.th 32 32 Labsolutions CS Network – The Best Solution for FDA21 CFR Part 11 Compliance http://nctc.in.th/labsolutions-cs-network-the-best-solution-for-fda21-cfr-part-11-compliance/ http://nctc.in.th/labsolutions-cs-network-the-best-solution-for-fda21-cfr-part-11-compliance/#respond Mon, 20 Aug 2018 15:56:43 +0000 http://nctc.in.th/?p=1580
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XRD Diffraction for QC and its Industry Applications Organized by NSTDA and Bruker AXS http://nctc.in.th/xrd-diffraction-for-qc-and-its-industry-applications-organized-by-nstda-and-bruker-axs/ http://nctc.in.th/xrd-diffraction-for-qc-and-its-industry-applications-organized-by-nstda-and-bruker-axs/#respond Thu, 02 Aug 2018 14:41:18 +0000 http://nctc.in.th/?p=1547 XRD Diffraction for QC and its Industry Applications
Organized by NSTDA and Bruker AXS

When & Where 28 August 2018, Tuesday 8:30 am – 4:00 pm

Sirindhorn Science Home NSTDA, Thailand Science Park

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Pushing the XRD Detection Limit Organized by NSTDA and Bruker AXS http://nctc.in.th/pushing-the-xrd-detection-limit/ http://nctc.in.th/pushing-the-xrd-detection-limit/#respond Thu, 02 Aug 2018 14:35:26 +0000 http://nctc.in.th/?p=1538 Pushing the XRD Detection Limit

When & Where 29 August 2018 (Wednesday)

8:30 am – 4:00 pm

Sirindhorn Science Home NSTDA, Thailand Science Park

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Applications of TEM to Advanced Material & Soft Matter http://nctc.in.th/applications-of-tem-to-advanced-material-soft-matter/ http://nctc.in.th/applications-of-tem-to-advanced-material-soft-matter/#respond Mon, 18 Jun 2018 06:48:13 +0000 http://nctc.in.th/?p=450
Read More]]> NSTDA Characterization and Testing Service Center (NCTC) and JEOL Asian Technical Center (JATC) jointly organized Seminar and Workshop: Applications of TEM to Advanced Material & Soft Matter on July 16, 2018 at Meeting Room CC-305, Thailand Science Park Convention Center.

The special lecture topic provided on “Direct Electromagnetic Field Imaging in Materials and Devices by Atomic-Resolution STEM” by Prof. Shibata Naoya from Institute of Engineering Innovation, The University of Tokyo

This seminar is free if charge, If anyone would like to attend please follow the link below:

Registration: >>> https://docs.google.com/forms/d/17_mIfquduD-JfmRWqnbsb45vwW3vTjdNqunBj-6AfF8/edit

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http://nctc.in.th/applications-of-tem-to-advanced-material-soft-matter/feed/ 0 Integration of Novel Technology for Surface Characterization http://nctc.in.th/integration-of-novel-technology-for-surface-characterization/ http://nctc.in.th/integration-of-novel-technology-for-surface-characterization/#respond Fri, 15 Jun 2018 18:46:33 +0000 http://nctc.in.th/?p=168 Integration of Novel Technology for Surface Characterization (10 July 2018)

Registration form:
https://docs.google.com/forms/d/10oXgzN26CbPf_g62MVXLYBt8HGs0ZF5-IlnWdFzpWiY/edit

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Surface Imaging Tools from the Millimetric to the Nanometric Scale http://nctc.in.th/nctc-seminar-and-workshop-novel-technology-for-surface/ http://nctc.in.th/nctc-seminar-and-workshop-novel-technology-for-surface/#comments Fri, 23 Dec 2016 15:31:31 +0000 http://celebration.packs.siteorigin.com/?p=1

Surface Imaging Tools from the Millimetric to the Nanometric Scale (09 July 2018)

Registration form:
https://docs.google.com/forms/d/10oXgzN26CbPf_g62MVXLYBt8HGs0ZF5-IlnWdFzpWiY/edit

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