Schottky Field Emission Scanning Electron Microscope
FE-SEM SU5000
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample’s surface, morphology, topography, measurement size and composition.
Specifications
| Magnification | 10-600,000x |
|---|---|
| Electron Optics: Emitter | ZrO / W Schottky emitter, Acceleration Voltage: 0.1-30 kV (0.1 kV step) |
| Variable Pressure Mode | Low vacuum mode Pressure Range 10-300 Pa |
| Detectors | Top detector, Lower detector, Ultra Variable-Pressure Detector (UVD), Backscatter Electron Detector(BSE), Energy Dispersive X-ray detector (EDS) |
| Type of sample | Solid, powder, thin film, nanoparticles, polymer, Fiber , biomaterial with coating Au, Pt, biological sample, non-conductive materials |
Applications
Materials Science
Life Sciences
Semiconductor / Electronics
Industry
Materials Science
Life Sciences
Semiconductor / Electronics
Industry