NSTDA Characterization and Testing Service Center (NCTC) and JEOL Asian Technical Center (JATC) jointly organized Seminar and Workshop: Applications of TEM to Advanced Material & Soft Matter on July 16, 2018 at Meeting Room CC-305, Thailand Science Park Convention Center.

The special lecture topic provided on “Direct Electromagnetic Field Imaging in Materials and Devices by Atomic-Resolution STEM” by Prof. Shibata Naoya from Institute of Engineering Innovation, The University of Tokyo

This seminar is free if charge, If anyone would like to attend please follow the link below:

Registration: >>> https://docs.google.com/forms/d/17_mIfquduD-JfmRWqnbsb45vwW3vTjdNqunBj-6AfF8/edit